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UrduAtomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope’s probe. A new AI technique overcomes this limitation and allows microscopes to resolve material features smaller than the probe’s tip.
Tag: Atomic Force Microscopy
Seeing electron orbital signatures
No one will ever be able to see a purely mathematical construct such as a perfect sphere. But now, scientists using supercomputer simulations and atomic resolution microscopes have imaged the signatures of electron orbitals, which are defined by mathematical equations of quantum mechanics and predict where an atom’s electron is most likely to be.
Imaging the Chemical Fingerprints of Molecules
Experiment, theory, and simulation show basic chemical properties are imprinted in atomic force microscope images and may help ID unknown molecules.
Quantum light squeezes the noise out of microscopy signals
Researchers at Oak Ridge National Laboratory used quantum optics to advance state-of-the-art microscopy and illuminate a path to detecting material properties with greater sensitivity than is possible with traditional tools.
Liam Collins: Mapping the unseen
As a scientist at the Department of Energy’s Oak Ridge National Laboratory, Liam Collins advances atomic force microscopy techniques to enable researchers to study materials and their properties on a nanometer length scale.
Looking at Atoms in Molecules to Make Cleaner Fuels from Petroleum
CFN staff and users from ExxonMobil have developed a new approach to identifying atoms that are neither carbon nor hydrogen within a specific type of molecule in crude oil.