Fast super-resolved microscopy with a structured illumination and extended depth detection.

Researchers at Institut Fresnel have developed an Extended Depth-of-Field Random Illumination Microscope (EDF-RIM) that integrates 3D speckle illumination for super-resolved imaging and extended depth detection for faster acquisition of thick samples. EDF-RIM captures entire 3D volumes in a single projection, reducing acquisition time and light exposure.

Improving resolution and reducing noise in fluorescence microscopy with ensured fidelity

Scientists developed a new method to improve resolution and reduce noise in fluorescence microscopy images. This technique utilizes mathematical tools to analyze and enhance image details, specifically addressing the fidelity of computational resolution extension. It outperforms existing methods by boosting signal-to-noise ratio and achieving higher resolution without introducing artifacts. This paves the way for more precise and informative imaging in various microscopy applications.